Kirk Sigmon is an associate in the firm’s Intellectual Property Group.
Mr. Sigmon received his B.A. magna cum laude from Wake Forest University and his J.D. cum laude from Cornell Law School. At Cornell, Mr. Sigmon was the general editor of the Cornell Journal of Law and Public Policy, the chief technologist of the Intellectual Property & Technology Association and the president of the Business Law Society. He was previously a summer associate at Morrison & Foerster.
Mr. Sigmon is fluent in conversational Japanese.
Microscan Systems, Inc. v. Cognex Corporation
(Southern District of New York). Won a jury verdict of infringement, validity, and reasonable royalty damages for plaintiff Microscan in a patent case related to high-end barcode scanners.